DFM is a leader in surface characterisation down to the nanometre scale, using both optical and tactile methods. We have more than 15 years of experience in the use of scanning probe microscopy (SPM), optical diffraction microscopy (ODM), ellipsometry, scatterometry, confocal microscopy and interference microscopy.
If you have questions, are looking for guidance or can not find what you are looking for on our website then contact us.
Our areas of competence
Surface condition and roughness
- Surface quality testing
- Measurement of roughness
- Custom measurements
- Calibration of roughness meters
- Key testing
- Calibration of roughness standards