Metrology Days 2025
ORGANIZER:
DFM
Co-organizers:
Danish Technological Institute
Force Technology
DATE:
August 26, 2025
POINT IN TIME:
08:30 – 17:00
LOCATION:
Classic Car House
Kongevejen 79
2800 Kgs. Lyngby
PRICE:
DKK 900,-
excl. VAT
Registration is closed
Metrology Day is held annually as a celebration of the signing of the Metre Convention on May 20, 1875 by representatives from 17 nations. The day is organized in collaboration with DFM, Danish Technological Institute and FORCE Technology and is this year hosted by DFM.
The Metre Convention set the framework for global cooperation in the science of measurement and in its industrial, commercial and societal applications. The original goal of the Metre Convention – the worldwide uniformity of measurement – is still as important today as it was in 1875.
This year we celebrate the 150th anniversary of the signing of the Metre Convention with a major program on 26 August 2025 with two parallel tracks – quantum and classical metrology. There will be exciting talks from a number of international and national celebrities.
Program
| The time | Joint program | |
| 8:30 – 9:00 | Registration, networking, sign-in and breakfast | |
| 9:00 – 9:15 | Welcome and introduction – Michael Kjær, DFM | |
| 9:15 – 10:15 | Quantum for Metrology and Metrology for Quantum – Carl J. Williams, CJW Quantum Consulting LLC | |
| 10:15 – 11:00 | Sensing and metrology with quantum systems – Klaus Mølmer, Niels Bohr Institute, University of Copenhagen | |
| 11:00 – 11:20 | Break, networking and poster session | |
| Quantum Metrology Program: | Classical Metrology Program: | |
| 11:20 – 11:50 | From color centres to applied quantum sensing – Alexander Huck, DTU | Optical temperature measurements – Henrik Kjeldsen, Danish Technological Institute, Mark Søndergaard Sørensen, Hyme and Jesper Bjerge, DFM |
| 11:50 – 12:10 | Towards Traceable Measurements in Quantum Sensing – Christian Bærentsen, DFM | |
| 12:10 – 13:30 | Lunch, networking and poster session | |
| 13:30 – 14:00 |
Deterministic photonic chips from fundamental science to commercial products – Peter Lodahl, Sparrow Quantum |
Microbial air sampling for disease monitoring – Karsten Brandt Andersen, AeroCollect |
| 14:00 – 14:30 |
Metrology for quantum photonics technologies at NPL – Christopher Chunnilall, NPL |
Hybrid spectroscopic platform for life-science – Mikael Lassen, DFM |
| 14:30 – 15:00 |
Break, networking and poster session |
|
| 15:00 – 15:30 | Data driven R&D towards large scale quantum computers – Peter Krogstrup, NQCP & Quantum Foundry CPH | Traceability in the verification of measuring systems for PtX media – Erik Jensen, Force Technology and Osmel Reyes, Endress+Hauser |
| 15:30 – 16:00 | Epitaxy of Quantum Devices & Metrology – Sabbir Khan, DFM | Digital Calibration Certificates – David Balslev-Harder, DFM |
| 16:00 – 16:45 | Decarbonization as Driver for the Transformation of Metrology in the Automotive Industry – Dietrich Imkamp, ZEISS | |
| 16:45 – 17:00 | Wrap-up and closing | |